pb LUR2042H-PF data sheet doc. no : qw0905-LUR2042H-PF rev. : a date : 30 - jan. - 2007 lead-free parts super bright round type led lamps ligitek electronics co.,ltd. property of ligitek only
3.0 4.0 5.2 1.0min 25.0min 25% note : 1.all dimension are in millimeter tolerance is 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. -60 100% 75%50%25% 0 directivity radiation -30 0 2.54typ + - 0.5 typ 4.2 1.5max 60 75% 50%100% 30 ligitek electronics co.,ltd. property of ligitek only package dimensions part no. LUR2042H-PF page 1/5
note : 1.the forward voltage data did not including 0.1v testing tolerance. 2. the luminous intensity data did not including 15% testing tolerance. absolute maximum ratings at ta=25 i fp pd i f tstg t opr esd symbol typical electrical & optical characteristics (ta=25 ) power dissipation reverse current @5v electrostatic discharge( * ) storage temperature operating temperature parameter peak forward current duty 1/10@10khz forward current 130 -40 ~ +100 -40 ~ +85 ir 2000 10 ratings ur(h) 100 50 mw v a ma ma unit ligitek electronics co.,ltd. property of ligitek only page 2/5 36 viewing angle 2 1/2 (deg) min. 900 20 min. 1.7 forward voltage @ ma(v) max. 2.6 dominant wave length dnm 630 spectral halfwidth nm 20 typ. luminous intensity @20ma(mcd) 1500 emitted red part no LUR2042H-PF material algainp/gap lens color white diffused static electricity or power surge will damage the led. use of a conductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. * part no. LUR2042H-PF
fig.4 relative intensity vs. temperature 3.0 2.5 2.0 1.5 0.5 1.0 0.0 1.0 r e l a t i v e i n t e n s i t y @ 2 0 m a wavelength (nm) 550 0.0 0.5 600650700 fig.3 forward voltage vs. temperature 0 fig.5 relative intensity vs. wavelength ambient temperature( ) f o r w a r d v o l t a g e @ 2 0 m a n o r m a l i z e @ 2 5 -40 0.8 -20 1.0 0.9 1.1 1.2 r e l a t i v e i n t e n s i t y @ 2 0 m a n o r m a l i z e @ 2 5 80 40 2060100 ambient temperature( ) -20 -4020 060 4080100 3.0 2.0 1.0 1.5 2.5 fig.2 relative intensity vs. forward current typical electro-optical characteristics curve 0.5 0.0 ligitek electronics co.,ltd. property of ligitek only fig.1 forward current vs. forward voltage forward voltage(v) f o r w a r d c u r r e n t ( m a ) 1.0 0 1 1.5 10 1 100 ur(h) chip 1000 r e l a t i v e i n t e n s i t y n o r m a l i z e @ 2 0 m a 2.02.53.0 3/5 page forward current(ma) 1101001000 3.5 part no. LUR2042H-PF
soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350 c max soldering time:3 seconds max(one time only) distance:2mm min(from solder joint to body) dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2 c/sec(max) ramp-down:-5 c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) note:1.wave solder should not be made more than one time. 2.you can just only select one of the soldering conditions as above. 2.wave soldering profile 60 seconds max preheat 0 25 0 120 2 /sec max 50 100 260 temp( c) 5 /sec max 260 c3sec max time(sec) 150 ligitek electronics co.,ltd. property of ligitek only page 4/5 part no. LUR2042H-PF
reliability test: test condition 1.ta=105 5 2.t=1000 hrs (-24hrs, +72hrs) 1.ta=-40 5 2.t=1000 hrs (-24hrs, +72hrs) 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, +72hrs) 1.t.sol=260 5 2.dwell time= 10 1sec. 1.ta=105 5 &-40 5 (10min) (10min) 2.total 10 cycles 1.t.sol=230 5 2.dwell time=5 1sec solder resistance test solderability test high temperature high humidity test 1.ta=65 5 2.rh=90%~95% 3.t=240hrs 2hrs thermal shock test low temperature storage test operating life test high temperature storage test test item this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. this test intended to see soldering well performed or not. mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this test is the resistance of the device under tropical for hours. mil-std-202:103b jis c 7021: b-11 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 jis c 7021: b-12 this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. description mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 mil-std-883:1008 jis c 7021: b-10 reference standard ligitek electronics co.,ltd. property of ligitek only page 5/5 part no. LUR2042H-PF
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